发明名称 MOLECULE SECONDARY ION MASS ANALYZER
摘要 PURPOSE:To irradiate the target with heavy ions having small deflection angle by applying a magnetic field to the ion accelerating region or ion extracting region in the primary ion source in order to deflect the light ions and by shielding them with slits. CONSTITUTION:A magnetic field generating means 5 consisting of plane permanent magnet in which the N and S poles are opposed to each other is provided between a lens electrode 2 and earth slit 3, in a high voltage ion source. The accelerated cluster ions sent from an ion generating part 1 are allowed to pass through the magnetic field generating means 5 in order to largely deflect the light ions 8'. The deflected light ions are eliminated by slit 3 and thereby only the heavy ions 8 are sent to the target 9. In this case, the lens electrode 2 and the magnetic field generating means 5 are integrated together and the structure can be formed compact through common use of the magnetic field generating means 6 having a pair of opposed poles as the lens electrode. Moreover, a large magnetic field intensity is no longer required in case the ions are deflected before they are sufficiently accelerated.
申请公布号 JPS59157943(A) 申请公布日期 1984.09.07
申请号 JP19830029502 申请日期 1983.02.25
申请人 HITACHI SEISAKUSHO KK 发明人 SEKI SETSUKO;KANBARA HIDEKI
分类号 H01J37/252;G01N27/62;H01J37/05;H01J49/10 主分类号 H01J37/252
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