发明名称 AUTOMATIC INSPECTING SYSTEM OF MICROCOMPUTER APPLIED CONTROLLER
摘要 PURPOSE:To extend the inspection width of a sequencer and shorten the inspection time by writing preliminarily external states, in which various inspection patterns appear, in an ROM and changing the pattern for every inspection. CONSTITUTION:An ROM5 where external states in which various inspection patterns appear are written is arranged in a supervisory CPU2. A main CPU1 receives the status signal from a device to be controlled through an input interface part 4 and transmits a control signal through an output interface part 3. At an inspection time, a prescribed inspection pattern is read out from the ROM5 by the supervisory CPU2 and is written in a latch 4B. It is checked whether the operation of the CPU1 is normal or not on a basis of this inspection pattern.
申请公布号 JPS59157717(A) 申请公布日期 1984.09.07
申请号 JP19830031971 申请日期 1983.02.28
申请人 MEIDENSHA KK 发明人 MATSUI TOSHIAKI
分类号 G05B23/02;G06F11/22 主分类号 G05B23/02
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