发明名称 DIRECT ANALYZER OF MOLTEN METAL IN DEEP LAYER BY FINE PARTICLE GENERATING PLASMA EMISSION SPECTROCHEMICAL METHOD
摘要 PURPOSE:To analyze directly molten metal constituents simply and rapidly at a working site by taking in a molten metal in a deep layer to a probe by removing a slag with a prescribed cap, and introducing fine particles evaporated by a spark discharge to an analyzer together with inert gas. CONSTITUTION:When a refractory cylinder 11 is lowered while blowing gaseous Ar, the cap 41 removes the slag and the molten metal in the deep layer is taken in. Next the spark discharge is performed between a counter electrode 8 and a sample electrode 17, and the fine particles evaporated and generated are sent to a plasma torch 29 together with gaseous Ar, excited and emitted to measure each constituent content. Thus, the direct analysis can be carried out simply at the working site.
申请公布号 JPS59157540(A) 申请公布日期 1984.09.06
申请号 JP19830030777 申请日期 1983.02.28
申请人 SHIN NIPPON SEITETSU KK 发明人 ONO AKIHIRO;SAEKI MASAO
分类号 G01N21/73;(IPC1-7):G01N21/73 主分类号 G01N21/73
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