发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain a wiring layer of a flat surface by a method wherein a first insulating film, an etching rate thereof is slow, and a second insulating film, an etching rate thereof is fast, are laminated on the contact extracting surface of a semiconductor substrate, contact holes are bored to the insulating films, the whole surface is coated with a wiring layer while burying the contact holes, the inferior sections of step coverages in the holes are removed, and the wiring layer is renewed and connected to said wiring layers remaining in the holes. CONSTITUTION:A first insulating film 2, an etching rate thereof is slow, and a second insulating film 6, an etching rate thereof is fast, are laminated and formed on a semiconductor substrate 1, contact holes 3 are bored, and the whole surface is coated with a wiring layer 4 while burying the contact holes. However, the film 6 is etched to expose the side walls 7 of the holes 3 while the film 6 is removed largely in the lateral direction because the inferior sections of step coverages are generated in the upper sections of the holes 3. The film 2 is removed together with the layer 4 of the upper section of the film 2, and the whole surface is coated with a similar wiring layer 4 while being brought into contact with said layers 4 buried in the film 2 in the holes 3 again.
申请公布号 JPS59155948(A) 申请公布日期 1984.09.05
申请号 JP19830031209 申请日期 1983.02.25
申请人 MITSUBISHI DENKI KK 发明人 EGUCHI KOUJI;OKAMOTO TATSUROU
分类号 H01L21/3205;H01L21/302;H01L21/3065 主分类号 H01L21/3205
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