发明名称 Method of manufacturing mask type read only memory
摘要 A method of manufacturing a mask type read only memory having an interconnection wiring and a plurality of MOS transistors, wherein selected source and drain regions are shortened in accordance with a user program after the interconnection wiring layer is formed on the semiconductor substrate. After that, a protective film is formed over the entire surface of the read only memory.
申请公布号 US4467520(A) 申请公布日期 1984.08.28
申请号 US19820408873 申请日期 1982.08.17
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 SHIOTARI, YOSHIHISA
分类号 G11C17/00;G11C17/08;H01L21/265;H01L21/8246;H01L27/112;H01L29/78;(IPC1-7):H01L21/26;H01L21/22 主分类号 G11C17/00
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