Probe for a printed-circuit testing device, and a testing device incorporating said probe

摘要

A probe for a device which serves to test both bare printed circuits and printed circuits equipped with components has a head machined in a conductive cylindrical segment placed at the end of a rod slidably mounted within a piston body. The probe head has a central pyramidal portion surrounded at its base by a crown provided with sharp curvilinear edges. Electrical contacts with either bare printed circuits or printed circuits equipped with components are established by the pyramidal portion and/or the crown, depending on the relative positions of the probe head and of the metallized holes or connection strips of the components or solder-spot connections of the circuits being tested.