发明名称 |
CHECKING DEVICE OF SURFACE DEFECT |
摘要 |
PURPOSE:To check a surface defect with high accuracy and high reliability by sampling a fixed information region by a separating circuit for fixed information region provided at a signal processing part and detecting the surface defect of a data recorded region. CONSTITUTION:A surface defect checking device 7 is provided with an optical system 8, a focus servo circuit 9 and a signal processing part 10. All additions of a 4-split detector 16 are carried out by an adder 21 and supplied to the part 10. The part 10 is connected to a computer. A fixed information region separating circuit 22 is provided at the part 10 to check a surface defect of a data recorded area A. An AND is obtained by an AND circuit 38 between the output 26 of a comparator 25 and the output 28 of a monostable multivibrator 27 to detect a surface defect signal 39 of the data recorded region from which a fixed information region B is sampled. In such a way, a surface defect can be detected with high accuracy and high reliability. |
申请公布号 |
JPS59148145(A) |
申请公布日期 |
1984.08.24 |
申请号 |
JP19830022274 |
申请日期 |
1983.02.14 |
申请人 |
FUJITSU KK |
发明人 |
MINAMI AKIRA;SHIBATA ITARU;ARAI SHIGERU;OGAWA KOUICHI |
分类号 |
G01N21/88;G01N21/95;G11B7/0037;G11B7/26 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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