发明名称 Nonvolatile semiconductor memory device and method of fabricating the same
摘要 A nonvolatile semiconductor memory device having a gate insulating film with a memory function. An impurity layer having the same conductivity type as that of the substrate region is formed in that substrate region, underlying the gate insulating film having a memory function, in which a channel is formed. The impurity layer has an impurity profile in which a peak of an impurity concentration is in the region distanced by 500 ANGSTROM or less from the surface of the substrate region and the impurity concentration is 1x1018 cm-3 or less in the region at the depth of 500 ANGSTROM or more.
申请公布号 US4467452(A) 申请公布日期 1984.08.21
申请号 US19810331066 申请日期 1981.12.15
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 SAITO, SHOZO;UCHIDA, YUKIMASA;HASHIMOTO, KAZUHIKO;ENDO, NORIO
分类号 H01L29/792;(IPC1-7):G11C11/40;H01L29/78 主分类号 H01L29/792
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