发明名称 |
Nonvolatile semiconductor memory device and method of fabricating the same |
摘要 |
A nonvolatile semiconductor memory device having a gate insulating film with a memory function. An impurity layer having the same conductivity type as that of the substrate region is formed in that substrate region, underlying the gate insulating film having a memory function, in which a channel is formed. The impurity layer has an impurity profile in which a peak of an impurity concentration is in the region distanced by 500 ANGSTROM or less from the surface of the substrate region and the impurity concentration is 1x1018 cm-3 or less in the region at the depth of 500 ANGSTROM or more.
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申请公布号 |
US4467452(A) |
申请公布日期 |
1984.08.21 |
申请号 |
US19810331066 |
申请日期 |
1981.12.15 |
申请人 |
TOKYO SHIBAURA DENKI KABUSHIKI KAISHA |
发明人 |
SAITO, SHOZO;UCHIDA, YUKIMASA;HASHIMOTO, KAZUHIKO;ENDO, NORIO |
分类号 |
H01L29/792;(IPC1-7):G11C11/40;H01L29/78 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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地址 |
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