发明名称 METHOD AND DEVICE FOR MEASURING THICKNESS BY ULTRASONIC WAVE
摘要 PURPOSE:To always execute an exact thickness measurement by inhibitting a level of a reflected echo by a rectifier provided in front of a probe. CONSTITUTION:A prove 2 and a rectifier 3 are provided in a probe capsule 1. A prescribed R is formed on the rear end face of this rectifier 3, by which an ultrasonic wave is reflected irregularly and attenuated. As a result, a level of a disturbing echo is suppressed to a level which does not cause an erroneous dedision to be regarded as a surface echo S. Accordingly, it can be prevented that a thickness measurement is executed by synchronizing with the disturbing echo, and a gate can be set at a prescribed position of B1-B2 at all times, following the surface echo S, therefore, the thickness measurement can be executed with high reliability. In this way, an exact thickness measurement can be executed at all times.
申请公布号 JPS59145911(A) 申请公布日期 1984.08.21
申请号 JP19830020322 申请日期 1983.02.09
申请人 SUMITOMO KINZOKU KOGYO KK 发明人 FUKUDA TOSHIBUMI;TANAKA HITOSHI
分类号 G01B17/02;(IPC1-7):G01B17/02 主分类号 G01B17/02
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