发明名称 OVERLOAD PROTECTION SYSTEM FOR METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR
摘要 PURPOSE:To limit the overcurrent to a proper current corresponding to the temperature of a MOS FET by always supervising a voltage between a drain and a source of the MOS FET and operating an overcurrent protection device when the voltage drop exceeds a predetermined value at current conduction. CONSTITUTION:When an on-signal is outputted from a gate control circuit 11 to a gate G of the MOS FET 12 and a current flows from a drain D to a source S, the voltage drop by the passing current is detected by a voltage detector 21. The on-signal is given also to an on-signal detector 22 to close a switch 23, then the detection voltage from a voltage detector 21 is given to a comparator 24 via the switch 23 and when it is larger than the set value decided by a setting resistor 25, a signal is fed to the gate control circuit 11 and an off-signal is given to the gate G. The overload protection device is operated even with a small current at a high temperature of the MOS FET having a positive resistance temperature coefficient, a large current is allowed at a low temperature so as to contribute to the improvement of the efficiency of the device.
申请公布号 JPS6265517(A) 申请公布日期 1987.03.24
申请号 JP19850204612 申请日期 1985.09.17
申请人 FUJI ELECTRIC CO LTD 发明人 KAGOYA TAKAMI
分类号 H01L29/78;H01L27/04;H02H7/20;H03K17/08 主分类号 H01L29/78
代理机构 代理人
主权项
地址