| 摘要 |
PURPOSE:To measure various types of integrated circuits at a high speed by editing a measuring program according to the results of a preliminary test. CONSTITUTION:An IC circuit 1 to be measured is measured with a preliminary test measuring section 3 using a test pattern according to types from a test pattern generator section 2 to select a code corresponding to types from a type selction correspondence list 4. Based on the code, the name of a measuring program test pattern is selected from an editing list 5 and when a corresponding program is found at fast processing storage sections 6 and 7, a measuring program is edited with a measuring program test pattern editing section 11 to measure the IC circuit 1. On the other hand, when there is no corresponding program at the sections, a corresponding program is transferred to the storage sections 6 and 7 from a large capacity storage section 8 through a transfer processing section 9 and an unnecessary program processing section 10 or the like. This editing construction enables a fast testing of various ICs without altering the overall program according to types. |
