发明名称 Subscriber connection circuit with test connection points within the circuit
摘要 In order to be able to achieve a central test unit, even when fuses Si1, Si2 located in the subscriber line wires a, b have blown, via an existing test output UTX of the subscriber connection circuit TSch, high-impedance voltage-proof voltage dividers RT1, RT2; RT3, RT4 whose partial voltage can be selectively connected to the test output are connected on the line side of the fuses. <IMAGE>
申请公布号 DE3304438(A1) 申请公布日期 1984.08.09
申请号 DE19833304438 申请日期 1983.02.09
申请人 SIEMENS AG 发明人 LECHNER,ROBERT,DIPL.-ING.;DRESCHER,MANFRED
分类号 H04M3/30;(IPC1-7):H04Q1/20;H04Q3/24 主分类号 H04M3/30
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