发明名称 TEMPERATURE COMPENSATED MEASURING SYSTEM
摘要 <p>This invention discloses a temperature-compensated measuring system which employs an internal signal-processor to provide high accuracy measurements, correct over a wide range of temperatures. In a calibration mode, the system employs the signal-processor to provide mathematical constants used to generate a temperature-compensation function. In a measurement mode, signals representing the uncompensated quantity and the system temperature are supplied to the signal-processor, which uses them to generate a temperaturecompensation function from which it produces a high-accuracy temperature-corrected value of the measured quantity. In various forms, the invention can be used to measure temperature-compensated force, pressure or acceleration.</p>
申请公布号 CA1171178(A) 申请公布日期 1984.07.17
申请号 CA19820400030 申请日期 1982.03.31
申请人 SETRA SYSTEMS, INC. 发明人 BRIEFER, DENNIS K.
分类号 G01L1/00;G01G3/18;G01G23/01;G01L19/04;G01L27/00;(IPC1-7):G01L1/00;G01G23/48;G01G23/36 主分类号 G01L1/00
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