发明名称 Method of patterning device regions by oxidizing patterned aluminum layer
摘要 A pattern utilized to prepare a diffraction grating, or an element of a semiconductor device, for example a silicon island, or a device isolation pattern or a semiconductor element, such as a MOS FET, is formed by the steps of forming an oxidizable region of a predetermined pattern on a substrate and oxidizing the oxidizable region for forming an oxide region pattern in at least a portion of the sidewalls of the oxidizable region. The resulting pattern, which is extremely fine and formed at a low cost, has a sufficiently large height with respect to its width. Furthermore the pattern can be formed at a relatively low temperature.
申请公布号 US4460413(A) 申请公布日期 1984.07.17
申请号 US19810331612 申请日期 1981.12.17
申请人 NIPPON TELEGRAPH & TELEPHONE PUBLIC CORP. 发明人 HIRATA, KAZUO;ODA, MASATOSHI
分类号 H01L21/033;H01L21/28;H01L21/316;H01L21/321;(IPC1-7):H01L21/76;H01L21/22;H01L29/78;H01L21/30 主分类号 H01L21/033
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