发明名称 |
Method of patterning device regions by oxidizing patterned aluminum layer |
摘要 |
A pattern utilized to prepare a diffraction grating, or an element of a semiconductor device, for example a silicon island, or a device isolation pattern or a semiconductor element, such as a MOS FET, is formed by the steps of forming an oxidizable region of a predetermined pattern on a substrate and oxidizing the oxidizable region for forming an oxide region pattern in at least a portion of the sidewalls of the oxidizable region. The resulting pattern, which is extremely fine and formed at a low cost, has a sufficiently large height with respect to its width. Furthermore the pattern can be formed at a relatively low temperature.
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申请公布号 |
US4460413(A) |
申请公布日期 |
1984.07.17 |
申请号 |
US19810331612 |
申请日期 |
1981.12.17 |
申请人 |
NIPPON TELEGRAPH & TELEPHONE PUBLIC CORP. |
发明人 |
HIRATA, KAZUO;ODA, MASATOSHI |
分类号 |
H01L21/033;H01L21/28;H01L21/316;H01L21/321;(IPC1-7):H01L21/76;H01L21/22;H01L29/78;H01L21/30 |
主分类号 |
H01L21/033 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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