| 摘要 |
<p>PURPOSE:To test the power supply state of a peripheral unit by delivering artificially an indication for application of power supply to a specific peripheral unit, and applying a power supply, and at the same time, obtaining an output of indication for application of power supply to the peripheral unit of the next stage from the specific peripheral unit and an indicating signal for application of power supply to the specific peripheral unit. CONSTITUTION:A controller 1 of a test device A sets an applying indication of power supply to a peripheral unit B at a register 2, and a part of the contents of the indication is applied in the sequence which is previously decided by a sequence selecting circuit 3. This indicating signal is supplied to a receiving circuit 6 of a device B via a driver 5, and the application of power supply is started. The signal state of the circuit 6 is set to a register 9 by a receiver 8 of the device A to replace the contents of the register 9. A transmitting circuit 7 of the device B delivers a power supply application indicating signal to the peripheral unit of the next state after a prescribed time elapsed from an indication for power supply application. At the same time, the application state of power supply to the device A is received by the receiver 8 and then set to a register 10. Then a fault is informed through a fault signal line 12 after an expected signal is obtained by deciding circuit 11.</p> |
