发明名称 Viewing and measuring apparatus
摘要 An apparatus for viewing and measuring using a partially reflective grating superimposed with the object. The invention provides efficient separation of viewing and measurement spectra from a common axis for a clear view of the object in conjunction with an accurate interferometric measuring system.
申请公布号 US4459026(A) 申请公布日期 1984.07.10
申请号 US19820384713 申请日期 1982.06.03
申请人 CANADIAN PATENTS & DEVELOPMENT LIMITED 发明人 PEKELSKY, JAMES R.
分类号 G01B9/02;G01B11/00;(IPC1-7):G01B9/02 主分类号 G01B9/02
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