发明名称 APPARATUS AND METHOD FOR THERMALLY TREATING A SEMICONDUCTOR SUBSTRATE
摘要 <p>According to the method, the substrate is isothermally heated to an elevated temperature near the thermal treatment temperature and then is further heated to a higher temperature at which the thermal treatment occurs. Following the thermal treatment the substrate is isothermally cooled to a sufficiently low temperature to avoid thermally induced defects. </p>
申请公布号 WO1984002540(A1) 申请公布日期 1984.07.05
申请号 US1983001659 申请日期 1983.10.24
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