发明名称 |
Resistive element formed in a semiconductor substrate |
摘要 |
A resistive element which is formed in a semiconductor substrate comprises a first semiconductor region which is formed in the semiconductor substrate and in which an impurity is diffused at a first concentration; a second semiconductor region which is connected to the first semiconductor region at one end and in which an impurity is diffused at a second concentration higher than the first impurity concentration; a third semiconductor region which is connected to the first semiconductor region at the other end and in which an impurity is diffused at a third concentration higher than the first impurity concentration; and the second and third semiconductor regions respectively including a portion whose cross section has a smaller area than the area of a boundary defined by the second and third semiconductor region with the first semiconductor region.
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申请公布号 |
US4455547(A) |
申请公布日期 |
1984.06.19 |
申请号 |
US19830455837 |
申请日期 |
1983.01.05 |
申请人 |
TOKYO SHIBAURA DENKI KABUSHIKI KAISHA |
发明人 |
MURAKAMI, KENJI;HAYASHI, SEIJI |
分类号 |
H01L29/8605;(IPC1-7):H01C1/02 |
主分类号 |
H01L29/8605 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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