发明名称 Resistive element formed in a semiconductor substrate
摘要 A resistive element which is formed in a semiconductor substrate comprises a first semiconductor region which is formed in the semiconductor substrate and in which an impurity is diffused at a first concentration; a second semiconductor region which is connected to the first semiconductor region at one end and in which an impurity is diffused at a second concentration higher than the first impurity concentration; a third semiconductor region which is connected to the first semiconductor region at the other end and in which an impurity is diffused at a third concentration higher than the first impurity concentration; and the second and third semiconductor regions respectively including a portion whose cross section has a smaller area than the area of a boundary defined by the second and third semiconductor region with the first semiconductor region.
申请公布号 US4455547(A) 申请公布日期 1984.06.19
申请号 US19830455837 申请日期 1983.01.05
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 MURAKAMI, KENJI;HAYASHI, SEIJI
分类号 H01L29/8605;(IPC1-7):H01C1/02 主分类号 H01L29/8605
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