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发明名称
INTEGRATED CIRCUIT TESTING ARRANGEMENTS
摘要
申请公布号
GB8411733(D0)
申请公布日期
1984.06.13
申请号
GB19840011733
申请日期
1984.05.09
申请人
GENERAL ELECTRIC CO PLC
发明人
分类号
G01R31/28;G06F11/27;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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