发明名称 |
Bipolar transistor integrated circuit and method for manufacturing. |
摘要 |
<p>A metal silicide contact to silicon devices which has broad application to almost all of the variety of silicon semiconductor devices is described. This contact with a substantial side component has particular advantage as the base contact for a bipolar transistor. Subsequent to the formation of the metal silicide contact layer (40) the surface of said metal silicide is thermally oxidized to form a silicon dioxide layer (42) thereover. This causes the silicide contact structure to sink into the silicon body to a depth at least as great as the emitter-base junction depth. The metal silicide contact (40) itself is contacted by contact elements (52) reaching from the surface through said silicon dioxide layer (42).</p> |
申请公布号 |
EP0110211(A2) |
申请公布日期 |
1984.06.13 |
申请号 |
EP19830111220 |
申请日期 |
1983.11.10 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
RISEMAN, JACOB |
分类号 |
H01L21/8222;H01L21/28;H01L21/285;H01L21/331;H01L27/06;H01L27/082;H01L29/423;H01L29/43;H01L29/45;H01L29/73;(IPC1-7):01L21/60;01L29/60;01L29/62;01L21/285 |
主分类号 |
H01L21/8222 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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