发明名称 RESIN SEALED TYPE SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To obtain the resin sealed type semiconductor device of excellent dampproof property and electric characteristics at a high temperatue by a method wherein a composition in which an epoxy resin hardener, having two or more of phenolic hydroxyl groups in a molecule, a polysulfide polymer and an organic phosphine compound are mixed in dissolved state, is used. CONSTITUTION:Phenol novolac resin is mixed, as a hardener, in novolac type epoxy resin having epoxy equivalent of 170-300, said phenolic hydroxyl group base and the epoxy resin are mixed in the epoxy base ratio of 0.5-1.5 or thereabout. Polysulfide polymer [H(S-R-S)nH, n>2] containing alkyl, alkyl ether and alkyl formar (R), which is concretely poly (diethylfomalin) disulphide (average n is 5-50), of 1-30wt% for the epoxy resin is added, and besides, an organic phosphine compound of 0.01-5wt% for the total quantity of the epoxy resin and the hardener is added, hardening is accelerated and an inorganic filler is added if necessary. When the semiconductor is sealed using the resin of this composition, a sealed device of dampproof having no lead at a high temperature can be obtained.</p>
申请公布号 JPS5999748(A) 申请公布日期 1984.06.08
申请号 JP19820208472 申请日期 1982.11.30
申请人 TOSHIBA KK 发明人 IKETANI HIROTOSHI;AZUMA MICHIYA
分类号 C08G59/00;C08G59/62;C08K5/49;C08L63/00;H01L23/29;H01L23/31 主分类号 C08G59/00
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