发明名称 INFRARED TEMPERATURE PROBE FOR HIGH PRESSURE USE
摘要 <p>An infrared temperature probe for high pressure use is in the form of a hollow bolt adapted to be threaded into a complementary threaded aperture in the wall of a pressure vessel with the end thereof disposed flush with the internal surface of the pressure vessel wall. An infrared transparent window is secured in the end of the hollow bolt with one surface thereof disposed flush with the end of the bolt. A bundle of optical fibers is secured within the opposite end of the hollow bolt and a glass rod is mounted within the hollow bolt in operative relation to the window and the optical fiber bundle for transmitting infrared radiation from the window to the optical fiber bundle. The interior of the hollow bolt may be supplied with a circulating cooling liquid or gas. An infrared temperature probe can also be used with a mold having an aperture for receiving an ejector pin wherein the hollow ejector pin is provided with an impact surface at one end and an infrared transparent window in the opposite end for receiving infrared radiation from a hot molded article within the mold when the ejector pin is located within the aperture in the mold. A bundle of optical fibers extends through the hollow ejector pin and is disposed in optical transmitting engagement with the window.</p>
申请公布号 EP0085143(A3) 申请公布日期 1984.06.06
申请号 EP19820110063 申请日期 1982.11.01
申请人 VANZETTI INFRARED AND COMPUTER SYSTEMS, INC. 发明人 DOSTOOMIAN, ASHOD S.;LORD, JOSEPH S.;DAVIS, JEFFREY R.
分类号 G01J5/08;G01J5/00;G01J5/04;(IPC1-7):01J5/04 主分类号 G01J5/08
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