发明名称 PERFECCIONAMIENTOS EN UN APARATO PARA MEDIR PARAMETROS CINETICOS EN UNA REACCION DE UN ANALIZADO CON UN REACTIVO ESPECIFICO
摘要 <p>PCT No. PCT/EP82/00195 Sec. 371 Date May 18, 1983 Sec. 102(e) Date May 18, 1983 PCT Filed Sep. 8, 1982 PCT Pub. No. WO83/01112 PCT Pub. Date Mar. 31, 1983.An analyte in solution is made to react with a spectific reactant coated on the wave-guide thus modifying the optical properties thereof. The index of refraction of the wave-guide material is higher than that of the reaction medium which ensures that a light signal injected into said guide be carried by multiple total reflection, the distance of penetration of the evanescent wave associated with the totally reflected signal being of the same order of magnitude or greater than the thickness of the analyte-reactant product layer.</p>
申请公布号 ES524166(D0) 申请公布日期 1984.06.01
申请号 ES19660005241 申请日期 1983.07.15
申请人 BATTELLE MEMORIAL INSTITUTE 发明人
分类号 G01N21/64;G01N21/27;G01N21/77;G01N33/543;G01N33/553;(IPC1-7):01N21/75;01N33/54 主分类号 G01N21/64
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