发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the flatness of interlayer insulating film layer remarkably eliminating the step disconnection on the upper wiring layer by a method wherein, after depositing the first insulating film, the first insulating film on the lower wiring is removed to deposit the second insulating film. CONSTITUTION:After forming a lower wiring layer 4 on an insulating layer 2 on a semiconductor substrate 1, an insulating film 3 is deposited. Next a photoresist pattern 6 is formed and only the insulating film 3 on the lower wiring 4 is removed by etching the insulating film 3 while the interlayer insulating films 3, 7 with their surfaces remarkably flattened are formed by depositing the insulating film 7. The upper wiring layer 5 may be formed with almost no irregularities at all since said interlayer insulating layers 3, 7 are remarkably flattened.
申请公布号 JPS5994847(A) 申请公布日期 1984.05.31
申请号 JP19820204760 申请日期 1982.11.22
申请人 NIPPON DENKI KK 发明人 FUJITA MITSUOKI
分类号 H01L21/3205;H01L21/306 主分类号 H01L21/3205
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