发明名称 APPARATUS FOR INSPECTING PATTERN
摘要 PURPOSE:To judge the quality of an object to be inspected with high accuracy, by calculating and obtain a scanning window from a picture element coordinates point with a level larger than the background level (BGL) of an image pattern to accurately take in image data. CONSTITUTION:The coordinates (xMIN, yMIN) of a reference point are subjected to initial setting by CPU2 and density level data corresponding to each picture element coordinates point (x, y) is taken out from video memory 5 to perform the comparison with BGL while X-coordinates when the former is larger than the latter or both of them are coincided are calculated from picture element coordinate points of four corners and a scanning window W is automatically set around an object S to be inspected within the visual field of a video camera 3. The intake of data is performed by scanning only the interior of the scanning window and, therefore, the number of data to be subjected to treatment are remarkably reduced while a time required in inspection is shortened.
申请公布号 JPS5988649(A) 申请公布日期 1984.05.22
申请号 JP19820199487 申请日期 1982.11.13
申请人 IZUMI DENKI KK 发明人 IKIMI TETSUYA
分类号 G01N21/93;G01N21/94;G01N21/956;G06T1/00 主分类号 G01N21/93
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