发明名称 COIL INSPECTING DEVICE
摘要 PURPOSE:To detect the abnormality such as a rare short of a coil to be tested, by utilizing the fact that a pulse voltage is reflected at a change point of impedance and detecting this reflected wave. CONSTITUTION:The pulse voltage from a pulse elective power source 3 is applied to a coil 1 to be tested, and this pulse voltage is detected by a cathode- ray tube oscilloscope or synchroscope 5A and is observed. In this case, an impedance adjusting device 6 is so adjusted that an unnecessary reflected wave is not generated and a waveform indicated in Fig. (a) is attained. If a rare short exists in the coil 1 to be tested, the reflected wave is generated in the rare short part, and a waveform having a different peak is obtained as shown by a point P in Fig. (b), and thus, the abnormality such as a rare short is detected.
申请公布号 JPS5987376(A) 申请公布日期 1984.05.19
申请号 JP19820199347 申请日期 1982.11.11
申请人 MITSUBISHI DENKI KK 发明人 SUMI MITSURU
分类号 G01R31/06;(IPC1-7):01R31/06 主分类号 G01R31/06
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