发明名称 |
Apparatus and method for inspecting a component. |
摘要 |
<p>A component (12) for dimensional inspection is rotated against a contrasting background while being scanned by an optical scanner (14) comprising a straight line array of sensors (18). The scanner resolution is sufficiently high to ensure that its output defines a linear dimension of the component (12) which contrasts strongly with its background. By rotating the scanner (14) (or the component (12)) a series of straight line scans is obtained. Given a recorded scan for an intolerance component it is possible to scan subsequent similar components and reject those with an out of tolerance scan or scans.</p> |
申请公布号 |
EP0108470(A1) |
申请公布日期 |
1984.05.16 |
申请号 |
EP19830304473 |
申请日期 |
1983.08.03 |
申请人 |
BL TECHNOLOGY LIMITED |
发明人 |
WILSON, JOHN FRANCIS;CARTWRIGHT, DAVID JOHN;MILLS, ROBERT |
分类号 |
G01B11/24;G01B11/02;(IPC1-7):01B11/04;04N7/18;01N21/88 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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