发明名称 Apparatus and method for inspecting a component.
摘要 <p>A component (12) for dimensional inspection is rotated against a contrasting background while being scanned by an optical scanner (14) comprising a straight line array of sensors (18). The scanner resolution is sufficiently high to ensure that its output defines a linear dimension of the component (12) which contrasts strongly with its background. By rotating the scanner (14) (or the component (12)) a series of straight line scans is obtained. Given a recorded scan for an intolerance component it is possible to scan subsequent similar components and reject those with an out of tolerance scan or scans.</p>
申请公布号 EP0108470(A1) 申请公布日期 1984.05.16
申请号 EP19830304473 申请日期 1983.08.03
申请人 BL TECHNOLOGY LIMITED 发明人 WILSON, JOHN FRANCIS;CARTWRIGHT, DAVID JOHN;MILLS, ROBERT
分类号 G01B11/24;G01B11/02;(IPC1-7):01B11/04;04N7/18;01N21/88 主分类号 G01B11/24
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