摘要 |
The automatic inspection device is of the same type as those used for checking or measuring electronic samples. The device 10 has a large number of very thin electrically conducting contact pins 17, 20 which are elastic in the axial direction. The pins are placed in holes, electrically insulated from each other, in a rigid support 11, 12 fitted with distancing plates 13. Each contact pin 17 is a metal wire which, because of its own axial elasticity, has at least one curved portion 22. The contact pin is placed in the support 11, 12 in such a way as to be shielded from rotation. <IMAGE> |