| 摘要 |
Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which one or more light sources and one or more detectors are mounted together on the same plane surface in close proximity to each other at an angle ( phi ) from the normal to the surface of the specimen holder. Angle ( phi ) is selected such that the specular reflection at the surface of the specimen is insignificant compared to the minimum diffused reflection expected from the specimen. |
