发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain an Si semiconductor device of high reliability at low cost by a method wherein a composite material made an invar alloy and copper or a copper alloy to mixedly exist is made as a substrate. CONSTITUTION:When copper or a copper alloy of good conductor, and an invar alloy of low expansive material are made to exist uniformly, both an electric and a heat currents can be improved. Granular powder or the linear bodies of the composite are bonded by pressing, or by heating, or by combining the processes thereof using a bonding agent. Moreover as the invar alloy, composition of 30-45% Ni and remainder of Fe is favorable substantially. Thermal expansivity is especially small when Ni is 33-37%. The ratio of the invar alloy is made to 20-80%, and especially when the ratio is 30-70%, the difference of thermal expansion between Si becomes more smaller.
申请公布号 JPS5979560(A) 申请公布日期 1984.05.08
申请号 JP19820189316 申请日期 1982.10.29
申请人 TOSHIBA KK 发明人 MOMOSE KENICHIROU;YAMANE SHIGEMI;SUGAI HIROZOU
分类号 H01L21/52;H01L23/492;H01L23/50 主分类号 H01L21/52
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