发明名称 REFLECTIVITY MEASURING DEVICE
摘要 PURPOSE:To measure even the light which is reflected by the sample surface as specular reflection without escape, by reflecting the light from a light source by a strip shaped reflecting mirror, which is provided around a light receiving element with a specified gap being provided, and projecting the light on the sample surface. CONSTITUTION:A disk shaped light receiving element 4 is kept in parallel with a sample surface 8a. A specified gap 12 is provided around the light receiving element 4, and a reflecting mirror 6 is attached to the inside of the lower part of a cabinet 7. Light 9 from a light source 5 is reflected by the reflecting mirror 6 and inputted to the sample surface 8a. Then, not only scattered reflected light 11 but also light 10, which is reflected by the sample surface 8a as specular reflection, are inputted to a light receiving surface 4a. Therefore, the reflectivity of even a glossy material can be accurately measured. Since all the light rays, which are emitted in the directions around the light receiving element 4 from the light source 5 are utilized, the utilization degree of the light is improved.
申请公布号 JPS5977340(A) 申请公布日期 1984.05.02
申请号 JP19820187110 申请日期 1982.10.25
申请人 MATSUSHITA DENKI SANGYO KK 发明人 TAMARU SHIYUUJI;MORITA MASAAKI
分类号 G01N21/47 主分类号 G01N21/47
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