Signal generator for digital spectrum analyzer.

摘要

A signal generator generates a test signal for input to a device under test the output signal of which is subjected to fast Fourier transform analysis by a fast Fourier transformer. A waveform memory (29) is read out in synchronism with data input to the fast Fourier transformer. The waveform memory (29) has stored therein sample values of a composite waveform of a plurality of predetermined spectra. The output read out from the waveform memory (29) is converted by a D/A converter (33) into an analog signal for use as the test signal.