发明名称 Method of producing semiconductor device.
摘要 <p>A bipolar or MOS semiconductor device is produced by self-alignment by the steps of (a) forming an insulating film on a semiconductor substrate, (b) forming a first conductive film, (c) forming a first masking film having a window, (d) anisotropically etching the conductive film to form an opening, (e) transversely etching the conductive film to form a protruding portion of the masking film, (f) forming a second masking film on the insulating film through the window, (g) etching an uncovered portion of the insulating film under the protruding portion, and (h) forming a second conductive film connecting the first conductive film and the exposed portion of the semiconductor substrate.</p>
申请公布号 EP0107416(A2) 申请公布日期 1984.05.02
申请号 EP19830305971 申请日期 1983.09.30
申请人 FUJITSU LIMITED 发明人 ITO, TAKASHI;SUGII, TOSHIHIRO;FUKANO, TETSU;HORIE, HIROSHI
分类号 H01L21/033;H01L21/311;H01L21/3213;H01L21/768;(IPC1-7):01L21/31;01L21/82 主分类号 H01L21/033
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