发明名称 Methods of and apparatus for detecting, measuring, and classifying insulation defects
摘要 During the manufacture and/or packaging of insulated conductors, insulation defects are detected, measured, and classified by the methods and apparatus of this invention. As a twisted pair of insulated conductors (21-21), for example, is advanced along a manufacturing line (25), the insulation covers (23-23) are engaged by a probe (32) which is connected to a source of electrical power and to an electrical circuit (30). The circuit is adapted to process signals received from the probe and to make comparisons with stored signals to indicate the occurrence of pinholes, faults or bare wire in the insulation covers. In order to be accurate in its comparison and classification, the circuit includes provisions for correcting for current flow between the probe and the metallic conductors prior to and subsequent to the pair being moved through the probe and for the thickness of the probe. Depending upon the nature of the defect and its frequency of occurrence, the circuit may be caused to discontinue further operation of the line.
申请公布号 US4446422(A) 申请公布日期 1984.05.01
申请号 US19810324367 申请日期 1981.11.24
申请人 AT&T TECHNOLOGIES, INC. 发明人 KOEHLER, PAUL G.;LEAHY, THOMAS P.;LICHLITER, THOMAS P.
分类号 G01R31/02;(IPC1-7):G01R31/12;G01R31/08 主分类号 G01R31/02
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