发明名称 ATOMIC ABSORPTION SPECTROPHOTOMETER
摘要 PURPOSE:To improve the accuracy in analysis by measuring the absorbancy index of an atom for analysis and the absorbancy index of the atom for purposes except for analysis, fume, etc. with a sample of an unknown concn. added with a standard sample of a known concn. and said sample without added with said standard sample. CONSTITUTION:The monochromatic light from a light source 1 passes a polarization prism, etc. and is applied as the monochromatic polarized light 5 having a light intensity I0 to a high temp. furnace 2. The light 5 is attenuated when it is scattered and absorbed by the specific atomized atom and the fume, etc. of said element in the furnace 2, whereby it is made to have the intensity of transmitted light I1. When a magnetic field is applied to the polarized light, the transmitted light I2 having a different intensity is obtd. by a Zeeman effect. The two values I1, I2 are determined with a sample of an unknown concn. added with a standard sample and the sample of an unknown concn., and the concn. of the specific atom is determined by an amplification and logarithmic conversion circuit 9, a signal storage circuit 10 and an arithmetic device 11.
申请公布号 JPS5975136(A) 申请公布日期 1984.04.27
申请号 JP19820185724 申请日期 1982.10.21
申请人 HITACHI SEISAKUSHO KK 发明人 OOISHI KOUNOSUKE;KOGA TADATAKA;KOIZUMI HIDEAKI
分类号 G01N21/31 主分类号 G01N21/31
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