发明名称 CONFIGURATION DEFECT INSPECTING DEVICE
摘要 PURPOSE:To inspect the defect in a configuration accurately in real time, by projecting parallel light rays on a liquid crystal display panel, on which the image of an object is displayed, converging the transmitted light rays by a lens, forming a Fourier transformation image corresponding to the object on a filter, on which the negative of a good Fourier transformation image is recorded, thereby detecting the amount of light transmitted through a filter. CONSTITUTION:Parallel light rays are projected on a liquid crystal display panel 7, on which an image 1' corresponding to an object 1 is displayed. The transmitted light rays are converged by a Fourier transformation lens 8, and the Fourier transformation image is formed on a focal point, i.e., a filter 9. When the configuration of the object 1 is changed, the amount of the transmitted light is changed, and the different Fourier transformation image is obtained. When the object 1 is a defective product, the light is transmitted through the filter 9 and inputted to a photodiode 10. Then, an output is generated from the photodiode 10. By detecting the level of the output of the photodiode 10, the defect in the configuration of the object 1 can be detected.
申请公布号 JPS5973711(A) 申请公布日期 1984.04.26
申请号 JP19820185881 申请日期 1982.10.20
申请人 MATSUSHITA DENKO KK 发明人 IWATSUKA MASAYUKI;INOUE TOSHINORI
分类号 G01B11/24;G01B11/30;G01N21/88;G01N21/956 主分类号 G01B11/24
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