发明名称 |
Pattern recognition method and apparatus. |
摘要 |
A pattern recognition apparatus and method, the apparatus comprising a correlation calculating circuit for calculating first correlations between each part of a image pattern data and a reference pattern data, the first correlation being expressed as R(X), where X is a variable factor representing a region storing the part of the image pattern data, and also comprising a second correlation calculating circuit for recognizing the position of a pattern most identical to the reference pattern by emphasizing the maximum value of the first correlations by converting each of the first correlations R(X) into a second correlation expressed as [R(X)-R(X- alpha )]-[R(X+ alpha )-R(X)], where alpha is a predetermined value determined in accordance with the size of the reference pattern data. |
申请公布号 |
EP0106534(A2) |
申请公布日期 |
1984.04.25 |
申请号 |
EP19830305360 |
申请日期 |
1983.09.13 |
申请人 |
FUJITSU LIMITED |
发明人 |
NAKASHIMA, MASATO;KOEZUKA, TETSUO;TSUKAHARA, HIROYUKI;INAGAKI, TAKEFUMI |
分类号 |
H01L21/68;G01B11/02;G06K9/64;G06T1/00;H01L21/60 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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