发明名称 DETECTING METHOD FOR DEFECTIVE ELEMENT OF TRANSISTOR INVERTER
摘要 PURPOSE:To enable to simply discriminate a defective element by sequentially inputing a base input to transistor elements of a transistor inverter to detect the DC input current. CONSTITUTION:A controller 10 outputs designation signals 17 for sequentially applying the base input to the transistors of a transistor inverter in the prescribed order, and outputs a start pulse (a) at every designation signal. An R-S flip-flop 14 is set by a pulse (a), and a monostable multivibrator 15 outputs a pulse (c) having the prescribed width by the pulse (a). An AND circuit 18 sequentially applies inputs to the designated transistor element, and turns ON the transistor element. The DC input current at that time is detected, and when the DC input current reaches the prescribed level within the prescribed period, it is judged that the element on the same arm, to which the base input is applied, is shortcircuited.
申请公布号 JPS5963984(A) 申请公布日期 1984.04.11
申请号 JP19820173328 申请日期 1982.10.04
申请人 TOSHIBA KK 发明人 MAEKAWA KATSU
分类号 H02M7/537;H02M7/539 主分类号 H02M7/537
代理机构 代理人
主权项
地址
您可能感兴趣的专利