发明名称 UNIVERSAL CIRCUIT BOARD TEST FIXTURE
摘要 <p>UNIVERSAL CIRCUIT BOARD TEST FIXTURE A universal circuit board probe assembly connects a variety of circuit board types to a diagnostic system. The probe assembly is an integrated system which includes a general purpose perforate platform having perforations in a uniform grid pattern, a plurality of floating connector pins of the type having an opposing double-action movement, a removable backing plate which confronts the platform, pin displacement modules which removably mount to the backing plate and are disposed to abut to the connector pins, means for aligning the backing plate with the platform and circuit board test points, means for urging the modules in contact with connector pins to activate the connector pins for testing, and means for causing the activated connector pins to engage test points on a circuit board to be tested.</p>
申请公布号 CA1165394(A) 申请公布日期 1984.04.10
申请号 CA19810384684 申请日期 1981.08.27
申请人 FLUKE (JOHN) MFG. CO., INC. 发明人 EVERETT, STEPHEN M.
分类号 G01R31/02;G01R1/067;G01R1/073;(IPC1-7):G01R31/28;H05K13/08;H05K1/00 主分类号 G01R31/02
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