发明名称 |
TEMPERATURE PATTERN MEASURING METHOD AND DEVICE THEREFOR |
摘要 |
<p>A temperature pattern measuring method and apparatus by which portions of light from parts of an area of an object the distribution pattern of the temperature of which is to be measured, which parts are in a predetermined pattern, are passed through first and second optical filters which pass different wavelengths of light, respectively. The level of energy passed by the respective filters for the respective portions of light are determined by scanning the light from the filters with a pickup device or devices and using the thus determined energy levels, an arithmetic unit carries out a two-color temperature determining operation for the respective parts of the area for determining the temperature on each part of the area of the object. The temperature pattern of the area of the object can thereby be determined from the temperatures of the parts of the area. Also, a supervision unit for the weld zone at an electrically seamed pipe, may employ the temperature pattern measuring unit of the present invention, the supervision unit producing a composite display of the form of the weld zone and the temperature pattern thereof.</p> |
申请公布号 |
CA1165444(A) |
申请公布日期 |
1984.04.10 |
申请号 |
CA19810371612 |
申请日期 |
1981.02.24 |
申请人 |
SUMITOMO KINZOKU KOGYO KABUSHIKI GAISHA |
发明人 |
TATSUWAKI, MASAO;NEMOTO, SHIN;KATAYAMA, YUTAKA;OKADA, MICHIO;HOTTA, KAZUYUKI;OKUHARA, SEIICHI |
分类号 |
G01J5/54;G01K11/12;(IPC1-7):G01J5/54 |
主分类号 |
G01J5/54 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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