发明名称 HEAT RESISTANCE MEASURING METHOD OF HIC
摘要 PURPOSE:To improve measurement precision sufficiently even when a collector current Ic is reduced by providing a resistor loop pattern around the active element of HIC, conducting when transient resistance is measured, and finding a fine emitter-base voltage DELTAVBE1 before and after the conduction. CONSTITUTION:The resistor loop pattern 8 which starts and ends at nearby terminals 6 and 7 is formed at the blank circumference of a power transistor (TR) pellet 4. Power TR driving terminals 9, 9, and 9 of the HIC are connected to a measuring circuit and an SW is turned on to conduct a fairly small amount of a collector current Ic by adjusting a variable resistor. The resistor loop pattern 8 is heated at the same time, so the power TR pellet 4 is driven in a thermally stable state regardless of the fairly small amount of the conduction current Ic and DELTAVEB1 is measured accurately, to measure the heat resistance.
申请公布号 JPS5960367(A) 申请公布日期 1984.04.06
申请号 JP19820171655 申请日期 1982.09.30
申请人 NEC HOME ELECTRONICS KK 发明人 MIZOGAMI SHIGEO
分类号 G01R31/26 主分类号 G01R31/26
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