发明名称 PATTERN INSPECTING DEVICE
摘要 PURPOSE:To eliminate an oversight of a minute defect by inputting a pattern data by a minute resolution, executing digitization consisting of plural points, collecting a part in the plural points to one point, and also detecting a partial point and a circumferential point, respectively. CONSTITUTION:A pattern data which becomes an object is written in a primary memory M by 10mum resolution, points 1-16 are set as a pattern part of logic 1, and other part is set as a non-pattern part of logic ''0''. Points 1-4 of an area (a) of this data are collected to one point by AND and OR gates 15, 16, and the logic 1 of points 5-16 in the circumference of the area (a) is counted by a counting circuit 10. An output SUM of this circuit 10 is provided to the first and the second comparing circuits 11, 12, and in case of SUM >=8, the pattern becomes the inside, a lacked pattern is emphasized, and in case of SUM<=4, the pattern becomes the outside, and a remaining pattern is emphasized. Also, at the time of a pattern boundary part, both of them are not emphasized by the second bit counting circuit 19 and the third comparing circuit 24, and a low resolution is outputted.
申请公布号 JPS5960573(A) 申请公布日期 1984.04.06
申请号 JP19820169509 申请日期 1982.09.30
申请人 FUJITSU KK 发明人 MITA KIKUO;ANDOU MORITOSHI;KAKIGI GIICHI
分类号 G06T1/00;G06K9/00 主分类号 G06T1/00
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