发明名称 INSPECTING AND MEASURING DEVICE OF POLARITY OF CHIP OR THE LIKE
摘要 PURPOSE:To direct a chip adequately and to measure its characteristic, by placing a rotating body freely rotatably in a chip conveyance path, and deciding the polarity of the chip. CONSTITUTION:A main device frame 1 is installed at an optional position in the midst of the chip conveyance path, a through hole 3 where the chip (t) stays temporarily is formed in a circular hollow part 2 provided at the center part of the main frame 1, and the circular rotator A is rotated by a pulse motor, etc. When the chip enters the through hole 3 from the chip conveyance path B, the rotator A is rotated to allow both ends of the chip to contact electric contacts D. Then, the polarity and characteristics of the chip are inspected and the rotator A is rotated on the bais of the result to face in an adequate direction, sending the chip to a lower chip conveyance path C. Consequently, the polarities of chips are set uniformly and easily and the characteristics are measured speedily.
申请公布号 JPS5956173(A) 申请公布日期 1984.03.31
申请号 JP19820167385 申请日期 1982.09.25
申请人 NITSUTOU KOGYO KK 发明人 KUBOTA SHIGERU;KANOU IKUJI;KUBO MASAHIRO
分类号 G01R31/18;B65G47/78;G01R27/00;G01R31/00;G01R31/316;H05K3/00;H05K13/02 主分类号 G01R31/18
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