发明名称 INSPECTING CICUIT OF SELF-INSPECTING PROPERTY
摘要 PURPOSE:To expand remarkably an applicable range of a self-inspecting property inspecting circuit to a non-sequence code output logical circuit, by utilizing a quality owned by a non-sequence code, and deforming a logical function which represents the code in one sense, to a self-inspecting form. CONSTITUTION:A code word of a non-sequence code Y is divided into groups Y<0>, Y<1>, the number of code words of each group is denoted as (h), (k), and when the code words belonging to each group are denoted as Y<0>i, Y<1>i, and AND of a logical variable of a logical value (1) is denoted as P<0>i, P<1>i, inspecting output U<0>, U<1> are obtained from a logical circuit 1 shown in the equations. In this state, a self-inspecting property inspecting circuit 2 is constituted by deforming the equations so as to satisfy both an FS property which does not output an erroneous code word even if a one directional degenerated fault is generated in the inside of the circuit, and an ST property which detects the one directional degenerated fault generated in the inside of the circuit by outputting the code word when a correct code word is inputted. This circuit 2 satisfies a code word error when the input condition non-sequence code Y is (0 1) covered and also (1 0) locally cover, and satisfies the FS property and the ST property with respect to the one directional degenerated fault.
申请公布号 JPS5953953(A) 申请公布日期 1984.03.28
申请号 JP19820163762 申请日期 1982.09.20
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 IZAWA NOBUYOSHI;WAKABAYASHI YOSHIO;HIRONO TADASHI
分类号 G06F11/22;G01R31/317;G06F11/00;G06F11/08 主分类号 G06F11/22
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