发明名称 ENCASING VESSEL FOR SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To measure a temperature rise of the encasing vessel on inspection or after mounting easily by setting up a heat-electricity converting element approximately just under a region on which a semiconductor element is placed. CONSTITUTION:The heat-electricity converting element is set up approximately just under the semiconductor-element placing section of the encasing vessel. For example, structure in which a thermocouple is incorporated in a ceramic-package 1 is formed, the thermocouple is formed by a metal A7 and a metal B8 at that time, and a temperature change of potential difference due to the contact of the metals of a different kind of A and B can be detected through leads 4, 4'. The metals 7, 8 are printed and formed previously before the package is manufactured. Accordingly, since the thermocouple for measuring the temperature rise or a resistor is unified with the encasing vessel, a temperature can be measured easily on inspection, and heat can be controlled easily.</p>
申请公布号 JPS5951556(A) 申请公布日期 1984.03.26
申请号 JP19820162562 申请日期 1982.09.17
申请人 MATSUSHITA DENKI SANGYO KK 发明人 KITAHIRO ISAMU
分类号 H01L21/66;H01L23/06;H01L23/14;H01L23/34;H01L27/00 主分类号 H01L21/66
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