发明名称 |
MIS TYPE SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE:To enable to restrain short channel effect without increasing source- drain resistance by using a source and a drain which make ohmic contact with the channel and Schottky contact with a substrate. CONSTITUTION:Since the aluminum source and drain 13 make Schottky contact with the N type Si substrate 10 and ohmic contact with the formed P type channel 15, the defect of small drain current which is found in conventional Schottky source-drain MOS type semiconductor elements is not recognized, and accordingly characteristics of a MOS type semiconductor element wherein a diffused layer is used for the source and drain are obtained. The source-drain resistance can be reduced by using aluminum for the source and drain, and the Schottky channel effect is difficult to generate. |
申请公布号 |
JPS5947767(A) |
申请公布日期 |
1984.03.17 |
申请号 |
JP19820156816 |
申请日期 |
1982.09.10 |
申请人 |
NIPPON DENSHIN DENWA KOSHA |
发明人 |
KATOU KINYA;WADA TSUTOMU;KAMIHIRA KAZUTAKE |
分类号 |
H01L29/78;(IPC1-7):01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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