发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 <p>PURPOSE:To improve the aged breakdown voltage of a dielectric film by setting a potential of on electrode of an information storage capacitive element of a DRAM higher than the intermediate voltage value between high and low level signal voltages fed to the other electrode and lower than a high-level signal voltage. CONSTITUTION:A fixed plate voltage Vp is applied to a plate electrode 9 functioning as one electrode of a MIS capacitive element of an information storage capacitive element C. Then the voltage Vp is set to a voltage higher than the voltage between a signal voltage Vcc and a signal voltage Vss and a voltage lower than the signal voltage Vcc, that is, the sum of 1/2Vcc and a voltage alpha. A signal voltage Vss or Vcc of a data line 18 is applied to a semiconductor region 7 functioning as the other electrode is applied through a MISFETQ. When the level of the plate electrode 9 is negative apparently, an electric field corresponding to 1/2Vcc-alpha is fed to the dielectric film 8, since the electric field applied to the dielectric film 8 is reduced, the aged breakdown voltage of the dielectric film 8 is improved.</p>
申请公布号 JPS62143292(A) 申请公布日期 1987.06.26
申请号 JP19850282874 申请日期 1985.12.18
申请人 HITACHI LTD 发明人 TSUKUNI KAZUYUKI;NOJIRI KAZUO;KOSAKA YUJI
分类号 G11C14/00;G11C11/34 主分类号 G11C14/00
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