发明名称 SEMICONDUCTOR NONVOLATILE MEMORY DEVICE
摘要 PURPOSE:To make one memory memorize two values and more of data by a method wherein an MNOS element and a floating gate type element are combined with each other providing two kinds of charge depositing regions such as a trap around the interface between an SiO2 film and an Si3N4 film and a floating gate. CONSTITUTION:The N layers 2, 3 are provided on a P type Si substrate 1 and an Si3N4 film 6 and successively a floating gate 9, a control gate 8 are laminated as specified respectively through the intermediary of an SiO2 film 7 and another SiO2 film 10. In case of writing, the layers 2, 3 and the substrate 1 are grounded to capture electrons around the films 6, 7 supplying the control electrode 8 with positive high voltage. In case of erasing, if the electrode 8, the layer 3 and the substrate 1 are grounded supplying a drain 2 with positive high voltage, only the charge in the gate 9 is erased while if the electrode 8 is grounded supplying the substrate 1 with positive high voltage, the captured electrons on the interface between the films 6, 7 are erased. In such a constitution, a memory device may be provided with a threshold value voltage with 3 values making one memory memorize 2 values and more of data by means of combining the charge plus (21) and minus (22) of the floating gate 9 with the captured charge plus (23) and minus (22) around the interface between the films 7, 6.
申请公布号 JPS5946067(A) 申请公布日期 1984.03.15
申请号 JP19820157729 申请日期 1982.09.08
申请人 MITSUBISHI DENKI KK 发明人 MATSUO RIYUUICHI
分类号 H01L21/8247;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/8247
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