| 摘要 |
<p>Thermal waves which may be used for imaging in thermal-wave microscopy, are generated in a sample (20 through local periodic heating by impinging an intensity modulated beam (22) of energy on a portion of the heated area on the surface of the sample (20). A laser probe beam (24) is focused on a portion of the heated area on the surface of the sample (20) in a manner such that the laser beam (24) is reflected from the surface. The angular displacement of the reflected beam, resulting from the local angular change in surface conditions of the sample (20) due to the thermal waves, are monitored by a split or quadrant detector (26). The displacement of the reflected beam is used to detect the thermal waves. </p> |
