发明名称 |
Method for deep level transient spectroscopy scanning and apparatus for carrying out the method |
摘要 |
A Deep Level Transient Spectroscopy (DLTS) method in which a high frequency measuring signal is applied continuously on a semiconductor junction, and exciting pulses are generated which are coupled through fast semiconductor switching elements to the junction to alternatively bias the junction in reverse and forward (or slightly reverse) directions. The high frequency measuring signal passed through the junction is evaluated by means of a lock-in amplifier phase-locked with a constant phase angle, independent of the repetition rate of the exciting pulses. The evaluation circuits of the apparatus including the lock-in amplifier are controlled by switching elements driven by control signals generated from the exciting pulses.
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申请公布号 |
US4437060(A) |
申请公布日期 |
1984.03.13 |
申请号 |
US19810269903 |
申请日期 |
1981.06.03 |
申请人 |
MAGYAR TUDOMANYOS AKADEMIA MUESZAKI FIZIKAI KUTATO INTEZETE |
发明人 |
FERENCZI, GYOERGY;HORVATH, PETER;TOTH, FERENC;KISS, JOZSEF;BODA, JANOS |
分类号 |
G01R31/26;H01L21/66;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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